The program for the Association of Test Publisher’s Innovations in Testing Conference (to be held February 7-10, 2010 in Orlando) is now available. As usual, there appear to be a large number of interesting presentations on the docket. Some that initially caught my eye focused on topics including a survey about the future of testing, detecting cheating, and ATP’s new revised guidelines on pre-employment integrity testing. Also, registration is open with a $75 discount to folks who do so before November 16.

Reid Klion